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Title: Optical vortex metrology: Are phase singularities foes or friends in optical metrology?
Type: Article in proceedingsArticle in proceedings
Participant(s):
Inviteret forfatter:  Takeda, M.
Technical University of Denmark

Inviteret forfatter:  Wang, W.
Technical University of Denmark

Invited author:  Hanson, Steen Grüner (Cwisno: 38344)
Technical University of Denmark
Email:

Inviteret forfatter:  Miyamoto, Y.
Technical University of Denmark
Abstract: We raise an issue whether phase singularities are foes or friends in optical metrology, and give an answer by introducing the principle and applications of a new technique which we recently proposed for displacement and flow measurements. The technique is called optical vortex metrology because it makes use of the unique characteristics of phase singularities as markers or tracers for the displacement and flow measurements. The phase singularities are created in the complex signal representation of a speckle-like random pattern, which is generated by means of a vortex filer operating a Riesz or Laguerre-Gauss transform to the random pattern.
© (2008) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Published: part of: Proceedings, 2008, SPIE - International Society for Optical Engineering, Bellingham
DOI:
Presented at: 8th International Conference on Correlation Optics, Chernivtsi
See the publication in DTU Orbit See the publication in DTU Orbit

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